The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 1995
Filed:
Feb. 22, 1993
David R Mattson, Madison, WI (US);
Randolph W Bach, McFarland, WI (US);
Scott A Callaghan, Verona, WI (US);
Stephen C Weibel, Madison, WI (US);
Mattson Instruments, Inc., Madison, WI (US);
Abstract
An interferometer including a beamsplitter and fixed and movable cube corner reflectors is adapted for use in a Fourier-transform infrared (FTIR) spectrometer. The spectrometer includes a cast metal base, such as of aluminum, with the interferometer including an IR source housing formed integrally with the base for dissipating heat via conduction. The IR source housing is hollow and open at the top for receiving a removable opaque printed circuit board (PCB) which is coupled to and provides support for and electrical current to an IR source within the housing. The housing includes two apertures in lateral portions thereof. An IR beam is directed by the source through a first aperture to the Michelson interferometer, while a second aperture is adapted to receive a fiber optic light guide to allow for direct viewing of the IR source in a safe manner without removing the PCB cover of the housing. An interferometer chamber is isolated from a sample chamber, both of which chambers may be independently purged and are further isolated from the spectrometer's electronic circuitry. The spectrometer includes a minimum number of reflectors outside of the interferometer for reduced light loss and improved signal-to-noise ratio with the interferometer providing an output IR beam to a first focus mirror which horizontally focuses the beam on and directs the beam through the sample and thence onto a second focus mirror which vertically focuses the beam on a closely spaced IR detector integrated in a printed circuit board.