The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1995
Filed:
Aug. 26, 1993
Masahiko Sumita, Yokohama, JP;
Takahiro Mukai, Yokohama, JP;
Kirin Techno-System Corporation, Yokohama, JP;
Abstract
A container inspecting apparatus for inspecting containers such as vials, ampuls, or the like has an inlet star wheel rotatable for admitting containers successively, and an outlet star wheel rotatable for discharging the containers successively. A plurality of feed units are movable along a circular path for successively receiving containers from the inlet star wheel, stopping the containers in respective inspecting positions, and successively transferring the containers to the outlet star wheel. A plurality of inspecting devices, each comprising an illuminating unit and an imaging unit, are disposed respectively in the inspecting positions for inspecting the containers in the respective inspecting positions. The feed units are intermittently moved along the circular path by a feeding and indexing device. A support mechanism is vertically mounted on each of the feed units for supporting bottoms of the containers on the feed units. The support mechanism is rotated to rotate the containers about their own axes while the containers are being inspected by the inspecting devices.