The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1995
Filed:
Nov. 18, 1993
Stanley E Nave, Evans, GA (US);
Ronald R Livingston, Aiken, SC (US);
William S Prather, Augusta, GA (US);
Abstract
A fiber optic probe and a method for using the probe for light scattering analyses of a sample. The probe includes a probe body with an inlet for admitting a sample into an interior sample chamber, a first optical fiber for transmitting light from a source into the chamber, and a second optical fiber for transmitting light to a detector such as a spectrophotometer. The interior surface of the probe carries a coating that substantially prevents non-scattered light from reaching the second fiber. The probe is placed in a region where the presence and concentration of an analyte of interest are to be detected, and a sample is admitted into the chamber. Exciting light is transmitted into the sample chamber by the first fiber, where the light interacts with the sample to produce Raman-scattered light. At least some of the Raman-scattered light is received by the second fiber and transmitted to the detector for analysis. Two Raman spectra are measured, at different pressures. The first spectrum is subtracted from the second to remove background effects, and the resulting sample Raman spectrum is compared to a set of stored library spectra to determine the presence and concentration of the analyte.