The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 1995

Filed:

Aug. 14, 1992
Applicant:
Inventor:

John D Osburn, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 95 ; 324627 ; 343703 ;
Abstract

An improved correlation method that computes E field measurements from voltage measurements produced by a TEM cell. Twelve voltage measurements are taken of radiation emanating from a device under test (DUT) for respective frequencies. The measurements are taken for the six faces of a hypothetical cube enclosing the DUT in both polarizations. Using these 12 measurements, the method identifies the face and polarization of the DUT which produces the highest emanation of radiation at that respective frequency. The method obtains three input voltages from these measurements and determines if the assumption of a dipole gain is adequate. If not, the actual gain is calculated and is used in a 3-input correlation algorithm to obtain more correct data regarding the E field emission of the DUT.


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