The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 1995

Filed:

Jul. 14, 1994
Applicant:
Inventors:

Steven P Floeder, Arden Hills, MN (US);

Josef A Graessle, Northine-Westphalia, DE;

John C Schultz, Afton, MN (US);

Werner R Schwarz, Northine-Westphalia, DE;

Frederick M Waltz, Mendota Heights, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q / ;
U.S. Cl.
CPC ...
435 39 ; 435 40 ; 435291 ;
Abstract

The present invention relates to a method and apparatus for counting the number of microorganism colonies present on a disposable microorganism culturing device having a substantially planar substrate. The preferred apparatus of the present invention includes an LED bar illuminating the surface of the substrate and a linear array of SELFOC lenses which focus the light reflected off of the substrate onto a linear CCD sensor array. The CCD sensor array is connected to a microprocessor which analyzes the raster-scanned data using the preferred algorithm. The preferred algorithm uses the sigma-shaped neighborhood for image processing. The preferred algorithm passes the sigma region across the image in a raster-scanned order to detect object starts and merges which yield a colony count for a scanned microorganism culturing device.


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