The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 1995

Filed:

Sep. 03, 1993
Applicant:
Inventors:

Philip W Morrison, Shaker Heights, OH (US);

Peter R Solomon, West Hartford, CT (US);

Robert M Carangelo, Glastonbury, CT (US);

David G Hamblen, East Hampton, CT (US);

Assignee:

On-Line Technologies, Inc., East Hartford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
156626 ; 427-8 ; 427 10 ; 20419213 ; 20419233 ; 356381 ;
Abstract

The method and apparatus of the invention permit in situ determinations to be made of the temperature and optical constants of a substrate surface that is being treated, by measurements of radiance, reflectance and transmittance. These determinations in turn provide, at any given instant during processing, compositional and other information, thereby affording highly effective feedback control of the processing conditions. The apparatus comprises an integrated, small and relatively inexpensive instrument for process monitoring.


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