The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1995

Filed:

Sep. 30, 1994
Applicant:
Inventors:

David A Epstein, Ossining, NY (US);

Jaroslaw R Rossignac, Ossining, NY (US);

Jeffrey W Wu, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
395122 ; 395120 ; 395126 ;
Abstract

Apparatus and method for generating displayable information expressive of a three dimensional solid object. The apparatus includes a processor (12,16) for expressing the object in a Constructive Solid Geometry representation thereof so as to be comprised of one or more primitive objects. The apparatus further includes a processor (18, 20) for repetitively evaluating the one or more primitive objects to determine displayable faces thereof. A depth interval buffer (20) is responsive to the operation of a scan conversion processor (18) for detecting when a predetermined number of repetitive evaluations occur without causing a change in the determination of a displayable face and for causing the operation of the evaluation processor to terminate. Toleranced depth tests are used to remove dangling faces or edges and to properly handle coincident faces. Pixel-centering is employed to improve the accuracy of depth tests and to identify pixels upon which a product projects. Shadowing is accomplished using a two-pass scan-conversion technique with an auxiliary shadow-buffer (ZS).


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