The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1995

Filed:

Oct. 02, 1992
Applicant:
Inventors:

Masao Asai, Kawasaki, JP;

Yuji Shibata, Kawasaki, JP;

Makoto Okazaki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 491 ; 371 204 ; 371 23 ;
Abstract

A parity inversion test system includes an interface part having an input side coupled to a N-bit data line and an output side coupled to a M-bit data line, where N<M, an output coupling part for coupling at least a part of a data output from the output side of the interface part to the data output from the output side of the interface part in a test mode so as to output a M-bit data, a parity generating part for generating a parity data with respect to the M-bit data output to the M-bit data line via the output coupling part based on the M-bit data, and a parity inversion bit specifying part for specifying arbitrary bits of the M-bit data output to the M-bit data line which are to be inverted when generating the parity data in the parity generating part.


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