The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1995
Filed:
Jan. 15, 1993
Hiroyuki Kitoh, Nagoya, JP;
Masatoshi Ohshima, Aichi, JP;
Sanyo Machine Works, Ltd., Aichi, JP;
Abstract
A three-dimensional measuring apparatus includes a minimum of a pair of CCD cameras which respectively pick up an image of an objective surface of an objective workpiece requiring dimensional measurement. At least a single unit or a pair of laser scanner sequentially irradiates a plurality of spots on the measurable surface with laser beams. The spots respectively make up measuring points when operating the pair of CCD cameras for measuring dimensions of the objective surface. The laser scanner directly displays the results of the dimensional measurement on the objective surface. An image processing unit computes actual dimensions of the objective surface based on image data received from the pair of CCD cameras which computer system initially makes a comparison between dimensional data of the measured surface received from the image processing unit and basic data of the objective surface previously prepared in the course of designing the objective product, and then figures out a specific domain of the measured objective surface that has actually incurred error from the manufacturing process.