The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1995
Filed:
Dec. 23, 1993
Applicant:
Inventors:
Thomas L Barnes, Sunrise, FL (US);
James W Colburn, Margate, FL (US);
Catherine L Danial, Coconut Creek, FL (US);
Sangvorn Rutnarak, Long Grove, IL (US);
Assignee:
Abbott Laboratories, Abbott Park, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
324 714 ;
Abstract
A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.
Barnes, Thomas. (1995). Mechanical capture of count wafer for particle analysis (U.S. Patent No. 5402062). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5402062
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile