The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1995
Filed:
Aug. 22, 1994
Edmund Schiessle, Schorndorf, DE;
Khaldoun Alasafi, Schwabisch-Gmund, DE;
Ralf Gutohrlein, Fellbach-Schmiden, DE;
Mercedes-Benz AG, Stuttgart, DE;
Abstract
A device for measuring mechanical states of stress in components has a part of the device positively joined to the component whose mechanical states of stress are to be measured. The part of the device undergoes a change in a measurable variable in the event of a change in the mechanical states of stress. The part of the device is a layer which is deposited on the component and which has a layer structure containing less than 8% by weight of phosphorous, preferably up to 3% by weight of phosphorous, up to 2% by weight of an element of main group IV or V, in particular antimony, and up to 5% by weight of a transition metal element, in particular cobalt. The weight percentages resulting from the sum are increased up to 100% with nickel. The layer modifies the magnetic flux in a coil arrangement comprising at least one coil, and the change in the magnetic flux in the coil arrangement is evaluated and the mechanical state of stress of the component are deduced from the change in the magnetic flux.