The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1995

Filed:

Nov. 23, 1992
Applicant:
Inventors:

Thomas J Kremer, Loveland, OH (US);

Thomas J Ziegler, Cincinnati, OH (US);

Assignee:

The United States Shoe Corporation, Cincinnati, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; A61B / ;
U.S. Cl.
CPC ...
33810 ; 33200 ; 33573 ;
Abstract

There is provided a frame measurement platform for measuring the perpendicular distance between the two temples of an open eyeglass frame, and a method for using such a device. The platform includes a support, two spaced-apart reference members which are moveable with respect to each other, and measuring scale. The reference members define respective temple measuring planes which are substantially perpendicular to a reference measuring plane defined by the support. The measuring scale is used to measure the perpendicular distance between temples of an open eyeglass frame.


Find Patent Forward Citations

Kremer, Thomas. (1995). Frame measurement platform (U.S. Patent No. 5400522). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5400522

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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