The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 1995

Filed:

Jun. 14, 1993
Applicant:
Inventor:

Benjamin Eden, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
359208 ; 359225 ; 359351 ; 359859 ; 2502036 ;
Abstract

A multi-spectral optical imaging system comprising first and second facing, reflective surfaces defining a single optical axis, the first reflective surface being integrally formed on a single piece of metallic material, the single piece of metallic material having a central aperture through which the optical axis extends and a plurality of elongate rib members integrally formed thereon which define therebetween a plurality of openings communicating with the central aperture; and the second reflective surface having a focus on the optical axis, whereby radiation impinging on the first reflective surface is reflected therefrom towards the second reflective surface and further reflected from the second reflective surface towards the focus; scanning element associated with the second reflective surface for causing the second reflective surface to undergo scanning motion; beamsplitting element receiving radiation reflected from the second reflective surface; and plural detectors, each operating at a different optical wavelength and receiving radiation from the beamsplitting element.


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