The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 1995

Filed:

Feb. 26, 1993
Applicant:
Inventors:

Cornelis G De Kort, Eindhoven, NL;

Joris J Vrehen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324676 ; 324 725 ; 324149 ; 324753 ; 324754 ;
Abstract

A probe apparatus includes a probe contact connected to a storage capacitance via a photoconductive switch. The photoconductive switch can be operated at high speed by means of a pulsed laser. The laser pulses (L) are synchronized with a moment in the operation cycle of the circuit at which moment the voltage at the point under test is to be measured. After a number of pulses and operation cycles the storage capacitance is charged to the voltage value (V) to be measured. Then, the capacitance does not form a load on the point under test and the voltage (V) can be determined accurately.


Find Patent Forward Citations

De Kort, Cornelis. (1995). Probe apparatus and method for measuring high-frequency signals (U.S. Patent No. 5399978). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5399978

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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