The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 1995
Filed:
Jun. 25, 1993
Karl Lang, Jona, CH;
Mettler-Toledo AG, Greifensee, CH;
Abstract
A device for charging a measuring apparatus for thermal analysis with material specimens filled into containers includes a vertically displaceable gripping member and a rotatable specimen plate with a plurality of openings arranged in a circle. For transferring a specimen container to the measuring location in the measuring apparatus, the specimen container is moved underneath the gripping member by rotating the specimen plate, the gripping member is lowered and the specimen container is gripped by gripping fingers attached to the gripping member. The container is then raised from the specimen plate by raising the gripping member. Subsequently, the specimen plate is rotated until a recess in the specimen plate is located underneath the gripping member. The measuring location is also located directly underneath the gripping member. By lowering the gripping member through the recess in the specimen plate, the specimen container can now be placed on the measuring location and can be released for carrying out the measurement by spreading apart the gripping fingers.