The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 1995
Filed:
Jun. 09, 1994
Applicant:
Inventors:
Keiji Kawasaki, Nagoya, JP;
Koji Fushimi, Gifu, JP;
Assignee:
NGK Insulators, Ltd., Nagoya, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73593 ; 73629 ;
Abstract
An ultrasonic testing method for detection of flaws in a ball-shaped material to be tested using an ultrasonic probe, wherein a test frequency f (MHz) of the probe and a radius of curvature r (mm) of a tip portion of the probe satisfy the relationship 50 mm.ltoreq.r.sqroot.f.ltoreq.60 mm, and wherein the radius of curvature r (mm) of the tip portion and the diameter D (mm) of an oscillator of the probe satisfy the relationship 0.35 mm.ltoreq.D/r.ltoreq.0.50 mm. The method enables detection of surface and internal flaws in materials, particularly ceramic ball hearings having a diameter ranging from several tens of millimeters down to 10 mm or below.