The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1995
Filed:
Jan. 08, 1993
Applicant:
Inventors:
Shintaro Komatani, Kyoto, JP;
Yoshihiro Wakiyama, Kyoto, JP;
Yoshiaki Okada, Kyoto, JP;
Yoshinori Hosokawa, Kyoto, JP;
Assignee:
Horiba, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 98 ; 378110 ;
Abstract
An improved fluorescent x-ray instrument includes an x-ray tube for generating x-rays, with a control grid regulating the production of x-rays. An operator can set the voltage to be applied to the control grid, and a feedback system will set a desired voltage to the control grid. An operator will be provided an output signal representative of the monitor control grid voltage to enable the operator to determine the operative status of the x-ray tube.
Komatani, Shintaro. (1995). Fluorescent x-ray analyzer and monitoring system for increasing (U.S. Patent No. 5398274). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5398274
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile