The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1995
Filed:
Mar. 03, 1993
Ronald F Garritano, Flemington, NJ (US);
Rheometrics, Inc., Piscataway, NJ (US);
Abstract
A magnetic resonance analyzing apparatus includes a sampling region; a first temperature stabilization assembly for maintaining the sampling region at a predetermined temperature; a magnet for applying a base magnetic field to the sampling region; a coil for applying a first 0.degree. phase excitation pulse to the sampling region at a first time, and a second 90.degree. phase offset excitation pulse to the sampling region at a second time corresponding substantially to an end of a first time period during which an output signal emitted from the sample as a result of the first excitation pulse can not be detected; a detector for detecting the output signal in response to the excitation pulses; a computer for forming a free induction decay (FID) curve from the output signal, starting from a third time corresponding substantially to an end of a second time period during which an output signal emitted from the sample as a result of the second excitation pulse can not be detected, separating the FID curve into a Gaussian (crystallinity) curve, exponential (amorphous) curve, and intermediate (combination of crystallinity and amorphous) curve, and determining a characteristic of the sample in correspondence with y-axis intercepts of at least one of the Gaussian, exponential, intermediate and FID curves; and a second temperature stabilization assembly for controlling the temperature of the sample at the predetermined temperature prior to entering the sampling region.