The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1995
Filed:
Jul. 21, 1992
Rocco DiFoggio, Houston, TX (US);
Maya Sadhukhan, Katy, TX (US);
Western Atlas International, Inc., Houston, TX (US);
Abstract
The present invention is a method for improving the estimation of physical properties of a material based on the infrared spectrum of the material and the correlation between directly-measured properties of interest and the infrared spectra of a representative set of calibration specimens of the material. By intentionally introducing spectral distortion such as transmittance shifts, wavelength shifts, absorbance-baseline shifts and absorbance-baseline tilts into the infrared spectra of the representative specimens and then determining the correlation between the distorted spectra and the directly-measured properties before applying the correlation to the infrared spectrum of the sample being analyzed, the correlation is self-compensating for the types of distortion introduced.