The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1995
Filed:
Apr. 20, 1993
Mutsumi Hayashi, Otsu, JP;
Tatsuo Ogasawara, Otsu, JP;
Yayoi Mizutani, Otsu, JP;
Nobuyuki Kuriyama, Takehanajizoujiminamimachi, JP;
Toray Industries, Inc., Tokyo, JP;
Abstract
A plurality of cartridges are set to a cartridge standby section. Each cartridge has a specimen tub, a dilution tub and three reaction tubs, and a specimen is placed in the specimen tub in advance. A specimen dispensing unit first distributes the specimen from the specimen tub to three reaction tubs of the same cartridge. Thereafter the cartridges are successively transported to a first reagent dispensing section, a first reaction path, a second dispensing section, a second reaction path, an unreacted component removing section, a luminescent reagent dispensing section and a hydrogen peroxide dispensing section in the stated order. Examination processes including reagent dispensing and unreacted component removal are carried out simultaneously for the three reaction tubs of each cartridge. Finally, reaction mixtures are subjected to photometry in a photometric section. The cartridges are transported by a plurality of transport mechanisms provided for the respective sections and driven independently of one another. Where analytical curve corrections are effected, a specimen dispensing unit and each of sample cartridges holding sample specimens are moved relative to each other. At this time, different specimens are placed in the reaction tubs of the same cartridge to carry out the above examination processes. A new analytical curve is obtained from the results of examination thereof for use in subsequent examination processes.