The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1995
Filed:
Dec. 08, 1993
Zensho Kanda, Yamanashi, JP;
Katsuhiko Miyaguchi, Yamanashi, JP;
Masufumi Koike, Yamanashi, JP;
Tsuyoshi Hayakawa, Yamanashi, JP;
Naoki Morikawa, Yamanashi, JP;
Terumo Kabushiki Kaisha, Tokyo, JP;
Abstract
A test instrument for uniformly spreading a collected specimen on a reagent layer has a first opening for collecting the specimen, a specimen spreading layer having an upper surface a portion of which is exposed to the first opening, the reagent layer provided so that an upper surface thereof is in contact with the lower surface of the specimen spreading layer, and a support layer provided on a lower surface of the reagent layer. Even if the specimen does not attached itself in a uniform distribution over the large area of the first opening, it will be evenly distributed at the second opening, the opening area of which is smaller than that of the first opening at which measurement is performed. When an absorbing layer provided in the proximity of the edge portion of the first opening is supplied with an excess amount of the specimen, a direct path to the absorbing layer is blocked by the inner peripheral region of the first opening so that the absorbing layer is soaked via the spreading layer. Consequently, the specimen is distributed on the reagent layer uniformly and at a fixed concentration irrespective of the amount thereof.