The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 1995

Filed:

Oct. 15, 1993
Applicant:
Inventors:

Hiroshi Tsutsui, Yawata, JP;

Koichi Ohmori, Toyonaka, JP;

Tetsuro Ohtsuchi, Osaka, JP;

Sueki Baba, Suita, JP;

Masanori Watanabe, Katano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 9811 ; 378 989 ;
Abstract

An energy difference picture processing method comprises the steps of using a semiconductor radiation detector; providing two discriminating levels; dividing X-rays, which have passed through objects, into two kind energy zones; counting X-ray photons to obtain an X-ray picture; assembling, with corresponding coefficients, S(H), S(L), {S(H)}.sup.x and {S(L)}.sup.y, which are exponential functions of the S(H) and S(L), respectively, where S(H) is a logarithmically converted version of a picture of counts in a higher energy band and S(L) is a logarithmically converted version of a picture of counts in a lower energy band; and performing addition, subtraction, multiplication and/or division on these terms to provide a picture in which a particular one of the materials constituting the objects is selectively extracted or removed.


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