The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 1995

Filed:

Jun. 29, 1994
Applicant:
Inventors:

Mikio Kurachi, Aichi, JP;

Noritsugu Nozawa, Toyokawa, JP;

Yasuhisa Murakami, Anjo, JP;

Assignee:

Nidek Co., Ltd., Gamagori, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 356127 ;
Abstract

A lens meter including an illumination light source for illuminating a measurement target, a target projection optical system for projecting the measurement target onto an inspected lens, an observation optical system for observing a focused state of the projected target image and target moving device for moving the measurement target in an optical axis direction or the like to thereby measure a refracting power of the inspected lens on the basis of an amount in which the measurement target is moved in the optical axis direction. This lens meter includes a lens holder for holding the inspected lens substantially parallel to a plane on which the lens meter is installed, and a reflection system optical element for reflecting a measurement light passed through the inspected lens even times so that the measurement light is introduced into the observation optical system.


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