The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1995
Filed:
Jun. 10, 1993
Kenneth L Mason, Santa Barbara, CA (US);
Philip F Marino, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A robust method for determining a radiation imaging system focus error, that employs a focus sensor and an accompanying curve determined analytically or empirically according to the characteristics of the sensor, is disclosed. In a preferred embodiment, the focus sensor comprises two beamsplitters, a spacer, and three detectors comprising CCD array. The three detectors are constrained to satisfy radiation path length specifications, with respect to the beamsplitters and spacer. In the method, the curve representing variance vs. focus position is empirically determined. The focus sensor may then be aligned in an unused portion of an imaging system radiation field. The detectors simultaneously image the same scene, sampling it at three different focus positions. These sampled points are then fit to the empirically determined curve; a maximum of the fitted curve is a robust measure of the imaging system focus error.