The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 1995
Filed:
Sep. 08, 1993
Dean L Weideman, Lomita, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A method of optimizing the optical focus of an electro-optical sensor in preparation for accurately measuring an optical parameter thereof of the type including, but not limited to, dynamic range, modulation transfer function, minimum resolvable temperature difference and field of view, includes changing a focus of the sensor on a target image viewed by the sensor while obtaining successive output images produced by the sensor, constructing respective image vectors from respective ones of the output images, for each one of the image vectors transforming the image vector by transform to produce a transformed image vector of elements whose values correspond to spatial frequency content computing a sum of squares of elements of the transformed image vector to produce a focus metric and identifying the focus of the recorded image corresponding to the greatest focus metric as being the optimum focus.