The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1995

Filed:

Jun. 28, 1991
Applicant:
Inventor:

Paul A Winser, Redhill, GB;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395119 ; 395128 ; 395132 ;
Abstract

An image of objects in a three dimensional space is generated for display on a two dimensional regular pixel array by offset and span generations (OFGN, SPGN) for anti-alias filtering which causes multiple rendition of the image, with each rendition displaced by a sub-pixel offset (Nx,Ny) with respect to the previous rendition. Image primitives are rendered by a scan line algorithm using a linked active polygon list (APL) and a deleted polygon list (DPL) to enable vertical offsets to be effected. The deleted polygon list stores primitives which would not be effective for a given line but for the offset to enable anti-alias filtering. These polygons would not normally be available for processing when using the scan line algorithm. Economical hardware (600) is provided for horizontal edge correction of parameters such as depth (z) and texture coordinates (u,v).


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