The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1995

Filed:

Jul. 29, 1993
Applicant:
Inventors:

Ronald A Kita, Hollis, NH (US);

Sylvia C Tremblay, Nashua, NH (US);

Thomas M Lynch, Hudson, NH (US);

Assignee:

Digital Equipment Corporation, Maynard, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ; 364191 ;
Abstract

A method for generating test programs for an implementation of a specification that has been modeled as an extended finite state machine (EFSM), the EFSM including vertices and transitions, where the transitions represent functions to be performed by the implementation, including predicates and actions such as variable assignments. The method includes traversing the EFSM in a depth-first manner from a root model start state to a root model exit state, through intermediate vertices which may be normal states or models. Models include further vertices and transitions, and may be called as submodels or as go-to models, where a go-to model includes an EFSM exit state. The EFSM may be traversed exhaustively, such that all possible paths are traversed, or in a partial transition coverage mode, where a user-defined subset of the possible paths are traversed. Each traversed path is stored in a path file and converted into a test program in a predetermined language, such as C, for interfacing with the implementation to be tested and testing its functions as represented by the transitions taken. Traversal of the EFSM is made possible by the use of a model stack, a path stack and a variables stack, which keep track of all models called, transitions and vertices encountered, and variable values assigned or altered in the course of the traversal, with cross-referencing to ensure that any desired set of path files can be automatically generated while tracking all parameters necessary to conduct the traversal.


Find Patent Forward Citations

Kita, Ronald. (1995). Method and apparatus for generating tests for structures expressed as (U.S. Patent No. 5394347). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5394347

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…