The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1995

Filed:

Nov. 17, 1992
Applicant:
Inventors:

Stuart Inkpen, St. Phillips, CA;

John Hall, St. John's, CA;

Chris Marshall, St. John's, CA;

Chris Brobeck, Pouch Cove, CA;

Chris Nolan, St. John's, CA;

Assignee:

Instrumar Limited, St. John's, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364550 ; 2441 / ; 324693 ; 324632 ; 340580 ; 340962 ;
Abstract

An apparatus for identifying and measuring in real time substances overlying a surface comprises a plurality of electrodes, a temperature sensor, an electrode control system connected to the plurality of electrodes for defining an electric field, an amplitude and phase measurement system connected to the plurality of electrodes and to the electrode control system for measuring a plurality of currents responsive to the electric field and converting the currents to a measurement set and computer for storing a map comprising a partition of a vector space of predetermined characteristics of substances into regions of profiles corresponding to the substances which could be overlying the surface. The computer correlates the measurement set with the map thereby identifying and quantifying the substances overlying the surface and generates an output signal corresponding to the identity and quantity of substances overlying the surface. A display responsive to the output signal displays the identity and quantity of substances overlying the surface.


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