The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 1995
Filed:
Oct. 22, 1992
Applicant:
Inventors:
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359656 ; 359794 ;
Abstract
An optical system for microscopes includes an objective lens for collimating beams of light emanating from an object and an imaging lens for forming parallel beams emerging from the objective lens into an image of the object at a predetermined position, and satisfies the equation:
Tanaka, Takaaki. (1995). Optical system for microscopes (U.S. Patent No. 5394271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5394271
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile