The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 1995
Filed:
Feb. 05, 1993
Applicant:
Inventors:
Frederick Lanni, Pittsburgh, PA (US);
D Lansing Taylor, Pittsburgh, PA (US);
Brent Bailey, Pittsburgh, PA (US);
Assignee:
Carnegie Mellon University, Pittsburgh, PA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359386 ; 359368 ;
Abstract
In an improved optical microscope for observing a luminescent specimen, the specimen is excited by a time-multiplexed series of standing wave fields. Then an image of the specimen is recorded and displayed. This specimen can be incrementally moved and additional images can be created and combined. Images of the specimen can also be created when there are nodes or antinodes at the focal plane of the microscope. These images can also be combined to produce an improved image of the specimen.