The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1995

Filed:

Sep. 21, 1992
Applicant:
Inventors:

George M Thurston, Belmont, MA (US);

Douglas L Hayden, Cambridge, MA (US);

Victor G Taratuta, Boston, MA (US);

Joyce A Peetermans, Newton, MA (US);

George B Benedek, Belmont, MA (US);

Assignee:

Oculon Corporation, Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128633 ; 128653001 ; 128745 ;
Abstract

A method and apparatus for detecting cataractogenesis is disclosed. Quasielastic light scattering data are collected from the lens of an individual to be tested for cataractogenesis. The data are collected from specific and reproducible sites within the lens by means of measurements made using a reticle in the apparatus and processed by an autocorrelator. The data from the autocorrelator are then fit to a double exponential form of autocorrelation function and the resulting functional form is transformed to produce at least one dimensionless parameter F.sub.mos. This parameter has been found to change predictably with the individual's age and, accordingly, is useful in detecting and determining the degree of cataractogenesis in the individual.


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