The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 1995
Filed:
Dec. 20, 1993
Charles H Frazier, Pacific, WA (US);
Other;
Abstract
A method for manual inspection of gears. A simple, manual method and apparatus is provided for inspection of a variety of gears. The method is particularly useful for determination of helical angle deviation and taper in helical gears. The gear to be inspected is placed in a suitable holder, or on a smooth support surface. A selected master gear segment, manufactured to precise tolerances such that it would perfectly fit an inspected gear that has no error, is brought into stationary, meshing engagement with the inspected gear. The selected master gear segment is supported in a working position by a support structure in a manner that the selected master gear segment may be displaced about an axis with respect to a reference datum plane. Displacement of the selected master gear is by way of rotation of the gear about a pivot A two axis movement type unit which is used for measuring both helical angle deviation and taper. By utilizing a selected master gear segment of known length, the displacement of the measuring surface from the datum plane may be determined by way of a height gage.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile