The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1995
Filed:
May. 04, 1994
Masahiro Nakamura, Yokohama, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An inclination angle metering apparatus is arranged such that a beam from a light source is split into two beams by a half-mirror provided in a light path between the light source and the surface of a liquid. One beam is reflected by the liquid surface falls on a line sensor, and the other beam falls on the line sensor without reflected by the liquid surface. When a housing and the liquid are relatively inclined, an incident position of one beam changes on the line sensor, whereas an incident position of the other beam does not change. An inclination angle to the liquid surface is determined based on the incident position of one beam with respect to the incident position of the other beam.