The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Mar. 30, 1993
On-Kok Chang, San Jose, CA (US);
Valence Technology, Inc., San Jose, CA (US);
Abstract
A sample holder for diffraction analysis protects air or moisture sensitive samples and accommodates samples of different sizes, both without contributing to background noise. In particular, a sample holder for beam diffractometery includes a holder body having a substantially flat beam-facing top surface and a through-hole extending through the top surface, a piston fitted in the through-hole so as to travel along an axis of the through-hole, and a cup-shaped cap fitted over at least a portion of the top surface, surrounding the through-hole. To minimize background noise, the top surface of the holder body and a top surface of the piston are made of quartz. For sample loading, a substantially flat plate and a mechanism for removably attaching the plate so as to overlie the top surface of the holder body are provided. The cap may be made of thin plastic so as to not affect the incident X-ray beam.