The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Oct. 28, 1992
Steven D Millman, Mesa, AZ (US);
James P Garvey, Tempe, AZ (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method for generating and simulating test patterns to detect faults (57, 63) in an integrated circuit. The method comprises identifying all nets (27) which can potentially be shorted together. Each potential fault (34, 36, 37, 38, 39) is categorized as either a feedback fault or a non-feedback fault. A test pattern is generated to detect the selected potential fault. The test pattern is simulated to determine which additional potential faults are detected by the test pattern. Potential faults which are detected by the test pattern are deleted from the fault list (12). The method is repeated until no potential faults remain on the fault list (12).