The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Jan. 21, 1993
Toru Shiono, Tokyo, JP;
Toshitaka Senuma, Tokyo, JP;
Katsumi Matsuno, Kanagawa, JP;
Tokuya Fukuda, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
An integrated circuit for boundary scan is achieved to be simple structure. A testing apparatus 6 provides a testing data to a serial input port SI of a integrated circuit IC1 via a external terminal unit 2. The testing data is output to a parallel input port PI of the integrated circuit IC2 from a parallel output port SO of the integrated circuit IC1, then the testing data is output from the serial output port SO. The testing apparatus 6 compares with the testing data outputted to the integrated circuit IC1 and the testing data outputted from the integrated circuit IC2 so that a state of connection is detected between the parallel output port PO of the integrated circuit IC1 and the parallel input port PI of the integrated circuit IC2. The construction of the integrated circuits can be simplified by using both of inputting and outputting of the serial interface SIF.