The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1995

Filed:

May. 10, 1994
Applicant:
Inventors:

Suomi Kurihara, Atsugi, JP;

Haruki Kawada, Kawasaki, JP;

Kiyoshi Takimoto, Kawasaki, JP;

Yuji Kasanuki, Tokyo, JP;

Toshimitsu Kawase, Atsugi, JP;

Hisaaki Kawade, Yokohama, JP;

Ken Eguchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
369126 ; 250306 ;
Abstract

A probe for reading an information from an object and/or inputting an information to an object is disclosed. The probe has a supporting member and a rod-shaped projection of which the end is positioned opposed to the object for information reading therefrom and/or information input thereto. The rod-shaped projection protrudes from a partial area of the supporting member. The information reading from the object and/or information input to the object is effected at the longitudinal end of the probe. The probe provides precise and accurate output and/or input of information regardless of the surface state of the object.


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