The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Apr. 06, 1992
John G Rohrbaugh, Fort Collins, CO (US);
Thomas H Baker, Loveland, CO (US);
Michael J Bennett, Wellington, CO (US);
Mercedes E Gil, Fort Collins, CO (US);
Robert W Proulx, Fort Collins, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
The invention is a method for displaying wafer test results from an integrated circuit tester in real time. The method comprising the steps of: (a) receiving wafer dimensions and die dimensions from a wafer handler; (b) creating a template representative of a wafer having cells representative of a die from the wafer dimensions and the die dimensions; (c) displaying the template; (d) invoking a tester to test a selected die of a selected wafer; (e) receiving test results from the tester; (f) displaying the test results on a selected cell which corresponds to the selected die; and (g) repeating steps (d)-(f) as required.