The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Dec. 13, 1993
David A Chapin, Plano, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
A method for producing isostatically corrected gravity displays using available gravity data sets. The values of crustal density, density contrast between lower crust and mantle, and crustal thickness at sea level required for the Airy-Heiskanen equation are determined by analysis of the data set. Crustal density is determined by fractal analysis. Density contrast is determined by cross plotting Bouguer anomaly values versus elevation. Crustal thickness is determined by plotting power spectra of free-air gravity grids. The values are then used in the Airy-Heiskanen equation to provide the value of depth to crust-mantle boundary at each data point location in order to make accurate isostatic corrections and to produce accurate isostatically corrected displays.