The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
May. 06, 1991
Kristina H Hedengren, Schenectady, NY (US);
Richard O McCary, Schenectady, NY (US);
Robert P Alley, Myrtle Beach, SC (US);
Richard J Charles, Schenectady, NY (US);
William P Kornrumpf, Albany, NY (US);
John D Young, Rexford, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An eddy current probe array is disclosed comprising a plurality of spatially correlated eddy current probe elements sufficiently disposed within a flexible interconnecting structure to collect a discrete plurality of spatially correlated eddy current measurements for nondestructive near surface flaw detection. A plurality of precisely fabricated, substantially identical elements being sufficiently distributed can accommodate inspecting an area of conductor covered by the active width of the array in a single uni-directional scan. The array structure can flexibly conform to accommodate inspection of large, irregular, curved conductive surfaces which cannot be inspected by conventional means.