The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Jul. 29, 1993
Applicant:
Inventors:
Robert E Betzig, Chatham, NJ (US);
Igal M Brener, Eatontown, NJ (US);
Stephen G Grubb, Warren, NJ (US);
David A Miller, Fair Haven, NJ (US);
Assignee:
AT&T Corp., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250216 ; 250306 ;
Abstract
Apparatus and methods of near-field scanning optical microscopy (NSOM) are described. A sensing technique is used, in which a light source having an optical cavity is reflectively coupled to the sample surface. Changes in the surface properties of the sample at the sensed location alter the optical feedback in the light source. This leads to detectable changes in the output characteristics of the light source.
Quick Actions:
Betzig, Robert. (1995). Method and apparatus for near-field, scanning, optical microscopy by (U.S. Patent No. 5389779). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5389779
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile