The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 1995
Filed:
Jun. 30, 1992
Lloyd Stivison, West Sunbury, PA (US);
Henry Dimmick, Sr, Butler, PA (US);
AGR International, Inc., Butler, PA (US);
Abstract
Apparatus and method are provided for inspecting finish dimensions of and detecting finish defects on containers moving sequentially in a predetermined path. More than one container can be inspected simultaneously. The apparatus includes one or more inspection gauges suspended above the container path. A transport system is provided for aiding in moving containers through the gauges and simultaneously axially rotating the containers about a vertical axis. Rotation of the containers allows the inspection gauges to inspect the entire circumference of the containers at one or more levels on the container simultaneously. Defective containers are detected when the relative separation distance between the gauge plates of the inspection gauge falls outside predetermined limits. If a defective container is detected, a rejection assembly may be activated to physically remove the defective container from the container path. A suspension system permits transverse movement of the inspection gauges to accommodate non-concentric containers therethrough. The method of this invention includes inspecting containers using in the apparatus of this invention.