The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1995
Filed:
Apr. 28, 1994
Applicant:
Inventor:
Ronald E Tollum, Simi Valley, CA (US);
Assignee:
Wangtek, Inc., Simi Valley, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ;
U.S. Cl.
CPC ...
360 46 ; 360 55 ; 360 45 ;
Abstract
A look ahead detector based on a delay line is used in a pulse amplitude qualifier circuit to qualify detected peaks in a system for the recovery of magnetically recorded digital information. The analog signal is delayed by one cell period to create a delayed replica which is applied to the peak detector. The difference between the analog signal and the delayed replica is applied to a hysteresis flip flop to create a qualifying signal based on a threshold value proportional to the analog signal to gate the peak detected in the delayed replica.