The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 1995
Filed:
Mar. 05, 1993
Masaharu Okafuji, Osaka, JP;
Nagayoshi Ichise, Osaka, JP;
Mitsuo Odawara, Kitakyushu, JP;
Junichi Abe, Kitakyushu, JP;
Nippon Sheet Glass Co, Ltd., Osaka, JP;
Abstract
A flaw detection system that can detect not only bubbles, stones and knots but also flaws, such as cords and reams, that are subject to less optical changes in transmitted light is provided. A glass plate travelling in a manufacturing line is scanned with a beam spot in the direction orthogonally intersecting the manufacturing line. The light transmitted through the glass plate is received by an optical-fiber array arranged in a direction orthogonally intersecting the line. Optical fibers in the optical-fiber array are connected cyclically to a plurality of photomultipliers, which convert the light received by the optical fibers into electrical signals. Flaw signals are produced by extracting flaw information signals from these electrical signals in an analog processing section, and masking them in a masking section. Positional information indicating flaw patterns and positions is produced from these flaw signals.