The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 1995

Filed:

May. 18, 1993
Applicant:
Inventor:

Hideki Hatanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351205 ; 351211 ; 351221 ;
Abstract

An intraocular length measuring instrument according to the invention can avoid errors in measurement caused by the movement of a subject's eye, such as a blink or involuntary eye movement, and improve the accuracy of the measurement of an intraocular length of the eye. The intraocular length measuring instrument includes a pattern image projecting and receiving optical system for projecting a pattern image onto the cornea of the eye and receiving the pattern image into a two-dimensional image sensor; an interferometric system for producing interference light in such a way that measuring light is projected onto a surface of an intraocular object to be measured while reference light is projected onto a reference surface corresponding to the object surface and interference is caused between light reflected by the object surface and light reflected by the reference surface and causing a photosensor to receive the interference light and output an interference signal; a device for determining the position of the object surface by sampling interference signals output by the photosensor; a device for reading the data concerning the pattern image received by the two-dimensional image sensor at any point of time of the duration of the sampling in order to memorize the pattern image data in a memory medium; and means for determining the position of a corneal vertex from the pattern image data memorized in the memory medium.


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