The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 1995
Filed:
Dec. 23, 1992
Jochen Franzen, Bremen, DE;
Gerhard Heinen, Grasberg, DE;
Gerhard Weiss, Weyhe, DE;
Reemt-Holger Gabling, Bremen, DE;
Bruker-Franzen Analytik GmbH, , US;
Abstract
The measuring process for generating mass spectra using a sequentially-scanned quadrupole ion trap mass spectrometer, is improved by controlling the measurement of the ion packages ejected from the ion trap so that measurement takes place starting at the anticipated exit times of the ion packages and measurement continues only as far as possible for a time duration corresponding to the length of the ion packages. Measuring only during ion package ejection enables a measurement for the total number of ejected ions having a selected mass to be obtained by means of digital addition of the individual package measurements. Subsequent processing of the data can be carried out with practically only the fluctuations of normal ion counting statistics.