The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 1995

Filed:

Oct. 15, 1993
Applicant:
Inventors:

James C Fitch, Tulsa, OK (US);

Zhan Wu, Tulsa, OK (US);

Assignee:

Diagnetics, Inc., Tulsa, OK (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 6173 ; 73 6171 ; 110179 ; 131300 ;
Abstract

A contamination measurement apparatus for determining a level of particulate contamination in a fluid. The apparatus includes a filter for passing a fluid therethrough. A volume indicator produces movement of a test piston in response to the fluid passing through the filter. The flow decay characteristics of the fluid are determined in response to movement of the test piston. A back flush mechanism returns the fluid back through the filter by use of a back flush piston which reciprocates in a chamber between a first position wherein the back flush piston is engaged with the test piston, and a second position wherein the back flush piston is disengaged from the test piston so that the test piston is free to move in response to the fluid volume.


Find Patent Forward Citations

Fitch, James. (1995). Contamination measurement apparatus (U.S. Patent No. 5385043). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5385043

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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