The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1995
Filed:
Sep. 22, 1993
Shoichi Araki, Osaka, JP;
Hiroyoshi Nomura, Shijonawate, JP;
Noboru Wakami, Hirakata, JP;
Takeshi Imanaka, Katano, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
The apparatus of the present invention for determining existential conditions of objects on a certain detecting region, includes: a temperature distribution detecting section for obtaining a thermal image including a plurality of elements each having temperature data by detecting the temperature distribution on the detecting region; an element classifying section for classifying the plurality of elements in the thermal image into at least two groups, all elements belonging to one of the groups being in a certain temperature range, the temperature range of the one group being distinct from a temperature range of another one of the groups; a group selecting section for selecting at least one group of a relatively higher temperature range in the thermal image from the at least two groups; an element selecting section for selecting, among elements included in the selected group, elements having temperature data indicative of local temperature peaks in the thermal image; and an output section for outputting the number of the selected elements by the element selecting means as the number of objects on the detecting region.