The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1995
Filed:
Apr. 12, 1993
Richard G Paxman, Ann Arbor, MI (US);
Environmental Research Institute of Michigan, Ann Arbor, MI (US);
Abstract
A method and apparatus for obtaining fine resolution imaging of extended objects in the presence of unknown time-varying aberrations, wherein the method is accomplished by obtaining data corresponding to multiple, measurement-diverse images of the extended object collected for each of a plurality of aberration realizations. The object and unknown aberrations are then Jointly estimated, preferably using constrained likelihood-based estimation techniques. The apparatus utilizes a conventional optical system, at least two detector arrays for detecting a plurality of phase-diverse images, a shutter system so that a specklegram can be captured at each of the phase-diverse arrays for each of a plurality of aberration realizations, and a computer including a processor, sufficient memory restoring the digital data corresponding to the captured images, and logic for estimating the object and unknown aberrations.