The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 1995
Filed:
Sep. 17, 1992
Applicant:
Inventor:
Jonathan D Buttram, Villamont, VA (US);
Assignee:
The Babcock & Wilcox Company, New Orleans, LA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73598 ; 73600 ;
Abstract
The presence of a crack in a material and the orientation of the crack is determined by placing a transducer on the surface of the material for propagating a shear wave for reflection off of the back wall of the material. The reflected signal is evaluated such that no signal or a weak signal indicates the presence of a crack. The transducer is then held in place and rotated while propagating a shear wave in order to determine the orientation of the crack. The reflected shear wave is then evaluated in the same manner.